Dimensional metrology of lab-on-a-chip internal structures: a comparison of optical coherence tomography with confocal fluorescence microscopy-Reference-Cited by-同舟云学术

Dimensional metrology of lab-on-a-chip internal structures: a comparison of optical coherence tomography with confocal fluorescence microscopy

Author:

REYES D.R.¹,HALTER M.²,HWANG J.³

Affiliation:

1. Physical Measurement Laboratory; National Institute of Standards and Technology; Gaithersburg Maryland U.S.A.

2. Material Measurement Laboratory; National Institute of Standards and Technology; Gaithersburg Maryland U.S.A.

3. Physical Measurement Laboratory; National Institute of Standards and Technology; Boulder Colorado U.S.A.

Funder

National Institute of Standards and Technology

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

Reference15 articles.

1. One size fits all?;Becker;Lab. Chip.,2010

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

2. Optical Coherence Microscopy for Integrated Photonics Devices Imaging;2021 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC);2021-06-21