Techniques to estimate relative leaf area and cover of weeds in crops for yield loss prediction-Reference-Cited by-同舟云学术

Techniques to estimate relative leaf area and cover of weeds in crops for yield loss prediction

Published:1994-06 Issue:3 Volume:34 Page:167-175
ISSN:0043-1737
Container-title:Weed Research
language:en
Short-container-title:Weed Res

Author:

LOTZ L. A. P.,KROPFF M. J.,WALLINGA J.,BOS H. J.,GROENEVELD R. M. W.

Publisher

Wiley

Subject

Plant Science,Agronomy and Crop Science,Ecology, Evolution, Behavior and Systematics

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1365-3180.1994.tb01984.x/fullpdf

Reference19 articles.

1. BAM Bouwman(1991 ) Linking X-band radar scattering and optical reflectance to crop growth models. Wageningen, The Netherlands: Agricultural University of Wageningen, Ph.D. thesis.

2. NJJ Bunnik(1978 ) The multispectral reflectance of shortwave radiation by agricultural crops in relation with their morphological and optical properties. Wageningen. The Netherlands: Agricultural University Wageningen. Ph.D. thesis.

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