Interfacial chemistry in a ZnTe/CdSe superlattice studied by atom probe tomography and transmission electron microscopy strain measurements-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Interfacial chemistry in a ZnTe/CdSe superlattice studied by atom probe tomography and transmission electron microscopy strain measurements

Published:2016-01-08 Issue:2 Volume:262 Page:178-182
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:Journal of Microscopy

Author:

BONEF B.¹²,HAAS B.¹²,ROUVIÈRE J-L.¹²,ANDRÉ R.¹³,BOUGEROL C.¹³,GRENIER A.¹⁴,JOUNEAU P-H.¹⁴,ZUO J-M.⁵

Affiliation:

1. Université Grenoble Alpes; Grenoble France

2. CEA; INAC-SP2M; Grenoble France

3. CNRS; Institut Néel; Grenoble France

4. CEA, LETI; MINATEC Campus; Grenoble France

5. Department of Materials Science and Engineering; University of Illinois; Champaign Illinois U.S.A.

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/jmi.12340/fullpdf

Reference22 articles.

1. Atomic arrangement at ZnTe/CdSe interfaces determined by high resolution scanning transmission electron microscopy and atom probe tomography;Bonef;Appl. Phys. Lett.,2015

2. Atomistic simulations of the optical absorption of type-II CdSe/ZnTe superlattices;Boyer-Richard;Nanoscale Res. Lett.,2012

3. Elastic, electronic, and lattice dynamical properties of CdS, CdSe, and CdTe;Deligoz;Physica B.,2006

4. Atom probe crystallography;Gault;Mater. Today,2012

5. Influence of surface migration on the spatial resolution of pulsed laser atom probe tomography;Gault;J. Appl. Phys,2010

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Thermomechanical Cleave of Polycrystalline CdTe Solar Cells and its Applications: A Review;Solar RRL;2023-06-14

2. Crack Types, Mechanisms, and Suppression Methods during High-energy Beam Additive Manufacturing of Nickel-based Superalloys: A Review;Chinese Journal of Mechanical Engineering: Additive Manufacturing Frontiers;2022-12

3. Scanning electron diffraction tomography of strain;Inverse Problems;2020-12-18

4. Atomic-resolution structure imaging of defects and interfaces in compound semiconductors;Progress in Crystal Growth and Characterization of Materials;2020-11

5. Correlated TKD/EDS - TEM - APT analysis on selected interfaces of CoSi2 thin films;Ultramicroscopy;2019-11

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3