Carbon‐film‐based Zernike phase plates with smooth thickness gradient for phase‐contrast transmission electron microscopy with reduced fringing artefacts-Reference-Cited by-同舟云学术

Carbon‐film‐based Zernike phase plates with smooth thickness gradient for phase‐contrast transmission electron microscopy with reduced fringing artefacts

Published:2022-05-04 Issue:1 Volume:287 Page:45-58
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:Journal of Microscopy

Author:

Obermair M.¹^ORCID,Hettler S.¹²^ORCID,Dries M.¹,Hugenschmidt M.¹³^ORCID,Spiecker R.¹⁴,Gerthsen D.¹³

Affiliation:

1. Laboratory for Electron Microscopy (LEM) Karlsruhe Institute of Technology (KIT) Karlsruhe Germany

2. Laboratorio de Microscopías Avanzadas (LMA), Instituto de Nanociencia y Materiales de Aragón (INMA) Universidad de Zaragoza Zaragoza Spain

3. 3DMM2O – Cluster of Excellence (EXC‐2082/1–390761711) Karlsruhe Institute of Technology (KIT) Karlsruhe Germany

4. Laboratory for Applications of Synchrotron Radiation (LAS) Karlsruhe Institute of Technology (KIT) Karlsruhe Germany

Funder

Carl-Zeiss-Stiftung

Deutsche Forschungsgemeinschaft

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1111/jmi.13108

Reference32 articles.

1. The Theoretical Resolution Limit of the Electron Microscope

2. Invited Review Article: Methods for imaging weak-phase objects in electron microscopy

3. Phase plates in the transmission electron microscope: operating principles and applications

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