OPTICAL COMPONENTS FOR X-RAY MICROSCOPY-Reference-Cited by-同舟云学术

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OPTICAL COMPONENTS FOR X-RAY MICROSCOPY

Published:1980-06 Issue:1 Ultrasoft X-R Volume:342 Page:167-187
ISSN:0077-8923
Container-title:Annals of the New York Academy of Sciences
language:en
Short-container-title:Ann NY Acad Sci

Author:

Franks A.,Gale B.,Lindsey K.,Pugh D. J.,Robbie C. J.,Stedman M.

Publisher

Wiley

Subject

History and Philosophy of Science,General Biochemistry, Genetics and Molecular Biology,General Neuroscience

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1749-6632.1980.tb47218.x/fullpdf

Reference10 articles.

1. Spiegelsysteme streifenden Einfalls als abbildende Optiken für Röntgenstrahlen

2. 5. R. McClure, 1979 . Private communication.

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Instrumental aspects of x-ray microbeams in the range above 1 keV;Review of Scientific Instruments;1999-04

2. Influence of fabrication errors on Wölter mirror imaging performance;Applied Optics;1998-12-01

3. Non-contacting straightness measurement to nanometre accuracy;International Journal of Machine Tools and Manufacture;1995-02

4. X-ray microscopy;Applications of Synchrotron Radiation;1990

5. Aplanatic grazing incidence diffraction grating: a new optical element;Applied Optics;1986-09-15

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