Low‐energy electron microscopy intensity–voltage data – Factorization, sparse sampling and classification-Reference-Cited by-同舟云学术

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Low‐energy electron microscopy intensity–voltage data – Factorization, sparse sampling and classification

Published:2022-11-30 Issue:2 Volume:289 Page:91-106
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:Journal of Microscopy

Author:

Masia Francesco¹²^ORCID,Langbein Wolfgang²^ORCID,Fischer Simon³^ORCID,Krisponeit Jon‐Olaf³⁴^ORCID,Falta Jens³⁴^ORCID

Affiliation:

1. School of Biosciences Cardiff University Cardiff UK

2. School of Physics and Astronomy Cardiff University Cardiff UK

3. Institute of Solid State Physics University of Bremen Bremen Germany

4. MAPEX Center for Materials and Processes University of Bremen Bremen Germany

Funder

Deutsche Forschungsgemeinschaft

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1111/jmi.13155

Reference36 articles.

1. Surface Crystallography by LEED

2. The application of pseudopotentials to low-energy electron diffraction II: Calculation of the reflected intensities

3. Augmented-plane-wave approach to scattering of Bloch electrons by an interface

4. Intensity-voltage low-energy electron microscopy for functional materials characterization

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1. Rapid identification of micro and nanoplastics by line scan Raman micro-spectroscopy;Talanta;2024-01

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