Enhanced ferroelectric properties in BiAlO3 modified lead‐free Mn‐doped Bi0.5(Na0.8K0.2)0.5TiO3 thin films

Author:

Peng Jinghui1,Nie Hengchang2ORCID,Yuan Yuou1,Yong Xiao1,He Biao2,Wang Genshui2ORCID,Du Fanglin1,Shi Liang1,Qu Xiaofei1,Zhang Shuai1ORCID

Affiliation:

1. College of Materials Science and Engineering Qingdao University of Science and Technology Qingdao China

2. Key Laboratory of Inorganic Functional Materials and Devices Shanghai Institute of Ceramics Chinese Academy of Sciences Shanghai China

Abstract

AbstractMn‐doped (1‐x)Bi0.5(Na0.8K0.2)0.5TiO3xBiAlO3 (Mn:BNKT‐xBA) thin films were synthesized on lanthanum nickelate‐coated silicon substrates by sol‐gel method. The second phase issue of the film can be effectively addressed by optimizing the substrate, and the maximum polarization and breakdown strength can be increased by introducing the proper amount of Al3+, which is advantageous for the film for energy storage. The results have shown that the Mn:BNKT‐0.03BA film exhibits superior ferroelectric properties (with remanent polarization (Pr) of 23.72 µC/cm2, maximum polarization (Pmax) of 75.37 µC/cm2), which could be an excellent candidate for ferroelectric thin film capacitors.

Publisher

Wiley

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