EMI Noise Source Characterization for SiC and GaN Power Transistors in Synchronous Rectification DC-DC Converter

Author:

Ibuchi Takaaki1,Funaki Tsuyoshi1

Affiliation:

1. Graduate School of Engineering, Osaka University

Publisher

Institute of Electrical Engineers of Japan (IEE Japan)

Subject

Electrical and Electronic Engineering

Reference14 articles.

1. (1) A. M. Abou-Alfotouh, A. V. Radun, H.-R. Chang, and C. Winterhalter : “A 1-MHz hard-switched silicon carbide DC-DC converter”, IEEE Trans. Power Electron., Vol. 21, No. 4, pp. 880-889 (2006)

2. (2) Y. Wu, M. Jacob-Mitos, M. L. Moore, and S. Heikman : “A 97.8% efficient GaN HEMT boost converter with 300-W output power at 1 MHz”, IEEE Electron Device Lett., Vol. 29, No. 8, pp. 824-826 (2008)

3. (5) N. Oswald, P. Anthony, N. McNeill, and B. H. Stark : “An experimental investigation of the tradeoff between switching losses and EMI generation with hard-switched all-Si Si-SiC and all-SiC device combinations”, IEEE Trans. Power Electron., Vol. 29, No. 5, pp. 2393-2407 (2014)

4. (6) D. Han and B. Sarlioglu : “Comprehensive Study of the Performance of SiC MOSFET-Based Automotive DC-DC Converter Under the Influence of Parasitic Inductance”, IEEE Trans. Ind. Appl., Vol. 52, No. 6, pp. 5100-5111 (2016)

5. (7) D. Gonzalez, J. Balcells, A. Santolaria, J. Bunetel, J. Gago, D. Magnon, and S. Brehaut : “Conducted EMI Reduction in Power Converters by Means of Periodic Switching Frequency Modulation”, IEEE Trans. Power Electron., Vol. 22, No. 6, pp. 2271-2281 (2007)

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