Verification of Measurement Waveforms of Transient Electric Field caused by Micro-gap Spark using Optical Electric Field Probe-Reference-Cited by-同舟云学术

Verification of Measurement Waveforms of Transient Electric Field caused by Micro-gap Spark using Optical Electric Field Probe

Published:2018-10-01 Issue:10 Volume:138 Page:482-489
ISSN:0385-4205
Container-title:IEEJ Transactions on Fundamentals and Materials
language:en
Short-container-title:IEEJ Trans. FM

Author:

Taka Yoshinori¹,Kawamata Ken²,Ishigami Shinobu²,Minegishi Shigeki²,Fujiwara Osamu³

Affiliation:

1. Department of Electronic Engineering, Kushiro National College of Technology

2. Department of Electronic Engineering, Tohoku Gakuin University

3. The University of Electro-Communications

Publisher

Institute of Electrical Engineers of Japan (IEE Japan)

Subject

Electrical and Electronic Engineering

Link

https://www.jstage.jst.go.jp/article/ieejfms/138/10/138_482/_pdf

Reference13 articles.

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2. (2) M. Honda : “Charge and Discharge Events on the Non-grounded Small Metal Object”, J. Inst. Electrostat. Jpn., Vol. 41, No. 4, pp. 165-168 (2017-4) (in Japanese)

3. (3) A. P. Mynster and P. T. Jensen : “EMC for the IoT”, Proceedings of the 2016 International Symposium on Electromagnetic Compatibility (EMC EUROPE 2016), Wroclaw, Poland (2016-9)

4. (4) http://techon.nikkeibp.co.jp/article/WORD/20060224/113632/ (accessed February 5 2018)

5. (5) K. Kawamata, S. Ishigami, S. Minegishi, and O. Fujiwara : “Distance characteristic of electric field waveform and field peak value caused by micro gap ESD in a pair of spherical electrodes”, Proc. of International Symposium and Exhibition on Electromagnetic Compatibility (EMC Europe) (2017-9)

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