Waveform Conversion and Validation of Transient Magnetic Field due to ESD using Equivalent Circuit of Magnetic Near-field Probe-Reference-Cited by-同舟云学术

Waveform Conversion and Validation of Transient Magnetic Field due to ESD using Equivalent Circuit of Magnetic Near-field Probe

Published:2021-11-01 Issue:11 Volume:141 Page:606-614
ISSN:0385-4205
Container-title:IEEJ Transactions on Fundamentals and Materials
language:en
Short-container-title:IEEJ Trans. FM

Author:

Wang Jiaqing¹,Kawamata Ken²,Ishigami Shinobu²,Ishida Takeshi³,Fujiwara Osamu³

Affiliation:

1. Department of Electrical and Mechanical Engineering, Nagoya Institute of Technology

2. Department of Electronic Engineering, Tohoku Gakuin University

3. Noise Laboratory Co., LTD.

Publisher

Institute of Electrical Engineers of Japan (IEE Japan)

Subject

Electrical and Electronic Engineering

Link

https://www.jstage.jst.go.jp/article/ieejfms/141/11/141_606/_pdf

Reference23 articles.

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2. 本田昌實：「非接地の小型金属体の帯電と放電」, 静電気学誌, Vol. 41, No. 4, pp. 165-168 (2017-4)

3. (2) A. P. Mynster and P. T. Jensen : “EMC for the IoT”, Proc. of the 2016 International Symposium on Electromagnetic Compatibility (EMC EUROPE 2016), Wroclaw, Poland (Sep. 5-9, 2016)

4. (3) T. Ishida : “Wearable Device on EMC－International Standards Circumstance and Concerning EMC on Wearable Devices－”, J. Inst. Electrostat. Jpn, Vol. 41, No. 4, pp. 162-164 (2017-4) (in Japanese)

5. 石田武志：「ウエアラブル機器とEMC－ウエアラブル機器の国際規格動向およびEMCとの関わり－」, 静電気学誌, Vol. 41, No. 4, pp. 162-164 (2017-4)

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1. EMC Research Efforts in the IEEJ Technical Committee and State‐of‐the‐Art Case Studies on ESD Found in its Technical Papers;IEEJ Transactions on Electrical and Electronic Engineering;2024-06-18

2. Frequency Spectra and Generation Peaks of Magnetic Far-Fields Due to Collision ESD between Spherical Electrodes;IEEJ Transactions on Fundamentals and Materials;2022-07-01