Author:
Tilgner R.,Baumann J.,Beyfuss M.
Abstract
The influence on the thermal response of a sample under photothermal investigation is analyzed when real absorbing layers are used as a source of thermal waves. Experiments with glass and copper samples covered by various absorbing layers are described using a thermal-wave approach. It is demonstrated that matching the effusivities of absorber and substrate is essential for obtaining quantitative results even for absorber layers much thinner than their thermal-diffusion lengths; otherwise one has to determine very carefully the particular nonneglectable influence of the absorber layer on the measured complex temperature.
Publisher
Canadian Science Publishing
Subject
General Physics and Astronomy
Cited by
8 articles.
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