A new high-resolution dual-probe system for detecting and imaging thermal and plasma waves
Author:
Publisher
Wiley
Subject
Instrumentation,Atomic and Molecular Physics, and Optics
Reference14 articles.
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2. Direct and indirect dual-probe interferometers for accurate surface wave measurements;Measurement Science and Technology;1994-12-01
3. Thermal wave probe microscopy for materials characterization†;International Journal of Electronics;1994-07
4. Response of interferometer based probe systems to photodisplacement in layered media;Journal of Applied Physics;1994-07
5. Modelling of photoreflectance phenomena in layered media;Semiconductor Science and Technology;1993-08-01
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