Author:
Kuo P. K.,Lin M. J.,Reyes C. B.,Favro L. D.,Thomas R. L.,Kim D. S.,Zhang Shu-Yi,Inglehart L. J.,Fournier D.,Boccara A. C.,Yacoubi N.
Abstract
A mirage-effect thermal-wave method for the measurement of thermal diffusivities of solids is described. Data from two different laboratories are provided for various pure elements and compound semiconductor materials. In most cases the agreement with literature values is good.
Publisher
Canadian Science Publishing
Subject
General Physics and Astronomy
Cited by
105 articles.
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