Serial Section Scanning Electron Microscopy of Adult Brain Tissue Using Focused Ion Beam Milling-Reference-Cited by-同舟云学术

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Serial Section Scanning Electron Microscopy of Adult Brain Tissue Using Focused Ion Beam Milling

Published:2008-03-19 Issue:12 Volume:28 Page:2959-2964
ISSN:0270-6474
Container-title:Journal of Neuroscience
language:en
Short-container-title:Journal of Neuroscience

Author:

Knott G.,Marchman H.,Wall D.,Lich B.

Publisher

Society for Neuroscience

Subject

General Neuroscience

Cited by 588 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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