Influence of silicon wall thickness on the performance of structured CsI(Tl) scintillation screen based on oxidized silicon micropore array template in X-ray imaging-Reference-Cited by-同舟云学术

Influence of silicon wall thickness on the performance of structured CsI(Tl) scintillation screen based on oxidized silicon micropore array template in X-ray imaging

Published:2019-05-08 Issue:10 Volume:27 Page:14871
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Chen Hui,Gu Mu^ORCID,Sun Zhixiang,Liu Xiaolin,Liu Bo,Zhang Juannan,Huang Shiming,Ni Chen

Funder

National Natural Science Foundation of China

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference28 articles.

1. Scintillation detectors for x-rays

2. Inorganic scintillators in medical imaging

3. Structured CsI(Tl) scintillators for X-ray imaging applications

4. A study on spatial resolution of pixelated CsI(Tl) scintillator

5. New design of a structured CsI(Tl) screen for digital mammography

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