Pitfalls in the spectral measurements of polarization-altering metasurfaces

Abstract

The optical characterization of metasurfaces and nanostructures that alter the polarization of light is tricky and can lead to unphysical results, such as reflectance beyond unity. We track the origin of such pitfalls to the response of some typical optical components used in a commercial microscope or a custom-made setup. In particular, the beam splitter and some mirrors have different responses for both polarizations and can produce wrong results. A simple procedure is described to correct these erroneous results, based on the optical characterization of the different components in the optical setup. With this procedure, the experimental results match the numerical simulations perfectly. The methodology described here is simple and will enable the accurate spectral measurements of nanostructures and metasurfaces that alter the polarization of the incoming light.