Fast scanning in x-ray microscopy: the effects of offset in the central stop position

Author:

Vacek Everett1,Preissner Curt2ORCID,Deng Junjing2ORCID,Jacobsen Chris213ORCID

Affiliation:

1. Northwestern University

2. Argonne National Laboratory

3. Chemistry of Life Processes Institute

Abstract

Scanning of lightweight circular diffractive optics, separate from central stops and apertures, is emerging as an approach to exploit advances in synchrotron x-ray sources. We consider the effects in a scanning microscope of offsets between the optic and its central stop and find that scan ranges of up to about half the diameter of the optic are possible with only about a 10% increase in the focal spot width. For large scanning ranges, we present criteria for the working distance between the last aperture and the specimen to be imaged.

Funder

Basic Energy Sciences

National Institute of General Medical Sciences

Publisher

Optica Publishing Group

Subject

Atomic and Molecular Physics, and Optics,Engineering (miscellaneous),Electrical and Electronic Engineering

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