Chemical Contrast in X-Ray Microscopy and Spatially Resolved XANES Spectroscopy of Organic Specimens
Author:
Affiliation:
1. Department of Physics, State University of New York, Stony Brook, NY 11794.
2. EXXON Research and Engineering, Annandale, NJ 08801
Publisher
American Association for the Advancement of Science (AAAS)
Subject
Multidisciplinary
Reference20 articles.
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4. CAZAUX, J, THE INFLUENCE OF RADIATION-DAMAGE (MICROSCOPIC CAUSES) ON THE SENSITIVITY OF AUGER-ELECTRON SPECTROSCOPY AND X-RAY PHOTOELECTRON-SPECTROSCOPY, APPLIED SURFACE SCIENCE 20: 457 (1985).
5. CIMMINO, S, POLYMER ENGINEERING AND SCIENCE 24: 48 (1984).
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