Generalized ellipsometry for biaxial absorbing materials: determination of crystal orientation and optical constants of Sb_2S_3
Author:
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics
Reference15 articles.
1. Ueber die Gesetze der Reflexion und Brechung des Lichtes an der Grenze absorbirender Krystalle
2. Spectroscopic ellipsometry data analysis: measured versus calculated quantities
3. Generalized Ellipsometry for Surfaces with Directional Preference: Application to Diffraction Gratings*
4. Polarization-dependent optical parameters of arbitrarily anisotropic homogeneous layered systems
5. Ellipsometry on Anisotropic Materials: Bragg Conditions and Phonons in Dielectric Helical Thin Films
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