Principal angle, principal azimuth, and principal-angle ellipsometry of film-substrate systems
Author:
Publisher
The Optical Society
Subject
General Engineering
Reference9 articles.
1. Definitions and conventions in ellipsometry
2. Principal angle-of-incidence ellipsometry
3. A Photoelectric Method for the Determination of the Parameters of Elliptically Polarized Light
4. The Optical Constants of Several Metals in Vacuum*
5. Ellipsometric function of a film–substrate system: Applications to the design of reflection-type optical devices and to ellipsometry*
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1. Linear-to-circular polarization transformation upon reflection by a transparent thin film on a transparent substrate: analytical determination of principal angles and principal azimuths;Applied Optics;2018-11-05
2. Single-layer antireflection coatings on transparent substrates: Polarization-dependent response at oblique incidence;Optik;2017-09
3. Bare and thin-film-coated substrates with null reflection for p- and s-polarized light at the same angle of incidence: reflectance and ellipsometric parameters as functions of substrate refractive index and film thickness;Applied Optics;2016-10-14
4. Principal angles and principal azimuths of frustrated total internal reflection and optical tunneling by an embedded low-index thin film;Journal of the Optical Society of America A;2011-05-27
5. Return-path, multiple-principal-angle, internal-reflection ellipsometer for measuring IR optical properties of aqueous solutions;Applied Optics;2010-08-24
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