Bullet signature measurement with chromatic confocal sensor

Author:

Wei Hengzheng,Wang Weinong,Wang Xiaolin,Li Yiyi

Funder

National Key Research and Development Program of China

Fundamental Research Funds of National Institute of Metrology P. R.China

The Opening Project of Key Laboratory of Trace Science and Technology, Ministry of Public Security

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics,Engineering (miscellaneous),Electrical and Electronic Engineering

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Development and validation of a surface profiling system for end of line monitoring of microstructured elastomer seals based on chromatic confocal microscopy;Precision Engineering;2022-09

2. Test of a novel microlens grating based miniature spectrometers array for chromatic confocal technology;2022 8th International Conference on Nanomanufacturing & 4th AET Symposium on ACSM and Digital Manufacturing (Nanoman-AETS);2022-08-30

3. Chromatic confocal sensor with dual dispersion for extending the measuring range;10th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Micro- and Nano-Optics, Catenary Optics, and Subwavelength Electromagnetics;2021-12-13

4. Design of a line-scanning dispersive objective lens for chromatic confocal displacement sensor;10th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing and Metrology Technologies;2021-12-13

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