Development and validation of a surface profiling system for end of line monitoring of microstructured elastomer seals based on chromatic confocal microscopy-Reference-Cited by-同舟云学术

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Development and validation of a surface profiling system for end of line monitoring of microstructured elastomer seals based on chromatic confocal microscopy

Published:2022-09 Issue: Volume:77 Page:365-374
ISSN:0141-6359
Container-title:Precision Engineering
language:en
Short-container-title:Precision Engineering

Author:

Csőke Lóránt Tibor,Kautny Szabolcs,Domján László,Szarvas Gábor,Lugosi László,Csákányi Attila,Kollár Zsolt

Publisher

Elsevier BV

Subject

General Engineering

Reference39 articles.

1. Focus-wavelength encoded optical profilometer;Molesini;Opt Commun,1984

2. Non-contact on-machine measurement using a chromatic confocal probe for an ultra-precision turning machine;Zou;Int J Adv Manuf Technol,2016

3. Measurement uncertainty associated with chromatic confocal profilometry for 3D surface texture characterization of natural human enamel;Mullan;Dent Mater,2017

4. In-situ measurement of surface roughness using chromatic confocal sensor;Fu;Procedia CIRP,2020

5. 3D measurement of gears based on a line structured light sensor;Guo;Precis Eng,2020

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1. Optical path optimization of chromatic line confocal displacement sensor for high resolution and wide range;Optics Letters;2024-03-04

2. 光谱共焦显微技术研究进展;Laser & Optoelectronics Progress;2024

3. 光谱共焦显微成像技术与应用;Laser & Optoelectronics Progress;2023

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