Full-field thickness measurement of ultrathin liquid film in receding contact-induced nano-channel using surface plasmon resonance-Reference-Cited by-同舟云学术

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Full-field thickness measurement of ultrathin liquid film in receding contact-induced nano-channel using surface plasmon resonance

Published:2018-07-31 Issue:16 Volume:26 Page:20975
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Kim Iltai (Isaac),Paik Sokwon,Jeon Yang Bae,Park Jae Sung,Kim Hyunjung,Kim Hongchul

Funder

CEKO, Co., LTD

Texas A and M University (TAMU)

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference39 articles.

1. Microcomputer-enhanced optical investigation of transport processes with phase change in near-equilibrium thin liquid films

2. Inferred pressure gradient and fluid flow in a condensing sessile droplet based on the measured thickness profile

3. Thin film lubrication in the past 20 years

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1. Transmission interference fringe (TIF) technique for the dynamic visualization of evaporating droplet;Applied Physics Letters;2024-09-09

2. Investigating the origin of the far-field reflection interference fringe (RIF) of microdroplets;Journal of Applied Physics;2024-05-22

3. High Resolution Interferometric Imaging of Liquid-Solid Interfaces with HOTNNET;Experimental Mechanics;2022-10-28

4. Aperture total internal reflection (A-TIR) for contact angle measurement;Optics Express;2021-11-30

5. Angle-resolved spectral reflectometry with a digital light processing projector;Optics Express;2020-08-27

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