Experimental comparison of resolution and pattern fidelity in single- and double-layer planar lens lithography-Reference-Cited by-同舟云学术

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Experimental comparison of resolution and pattern fidelity in single- and double-layer planar lens lithography

Published:2006-03-01 Issue:3 Volume:23 Page:461
ISSN:0740-3224
Container-title:Journal of the Optical Society of America B
language:en
Short-container-title:J. Opt. Soc. Am. B

Author:

Melville David O. S.,Blaikie Richard J.

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics,Statistical and Nonlinear Physics

Reference11 articles.

1. Negative Refraction Makes a Perfect Lens

2. Physics of negative refractive index materials

3. THE ELECTRODYNAMICS OF SUBSTANCES WITH SIMULTANEOUSLY NEGATIVE VALUES OF $\epsilon$ AND μ

4. Submicron imaging with a planar silver lens

5. Super-resolution imaging through a planar silver layer

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3. Methods for Assessing Surface Cleanliness;Developments in Surface Contamination and Cleaning, Volume 12;2019

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