Unevenly spaced continuous measurement approach for dual rotating–retarder Mueller matrix ellipsometry-Reference-Cited by-同舟云学术

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Unevenly spaced continuous measurement approach for dual rotating–retarder Mueller matrix ellipsometry

Published:2019-05-07 Issue:10 Volume:27 Page:14736
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Meng Kai,Jiang Bo,Samolis Christos D.,Alrished Mohamad,Youcef-Toumi Kamal

Funder

Wuxi Friedrich Measurement and Control Instruments CO., Ltd

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference40 articles.

1. Photopolarimetric measurement of the Mueller matrix by Fourier analysis of a single detected signal

2. Mueller matrix ellipsometry with imperfect compensators

3. Spectroscopic ellipsometry — Past, present, and future

4. Dual rotating-compensator multichannel ellipsometer: instrument design for real-time Mueller matrix spectroscopy of surfaces and films

5. Mueller matrix imaging ellipsometry for nanostructure metrology

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Superachromatic polarization modulator for stable and complete polarization measurement over an ultra-wide spectral range;Optics Express;2022-04-20

2. Quantification and reduction of Poisson-Gaussian mixed noise induced errors in ellipsometry;Optics Express;2021-08-05

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