Precision of Brewster-angle methods for optical thin films
Author:
Publisher
The Optical Society
Subject
Computer Vision and Pattern Recognition,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference3 articles.
1. Determination of the Refractive Index of Thin Dielectric Films*
2. Effect of thin-film thickness on Abelès-type index measurements
3. Polarization State of Thin-Film Reflection*
Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Determining the complex refractive index from two discrete angles in the specular reflectance profile of p polarized light;Measurement Science and Technology;2022-10-25
2. Terahertz Time-Domain Polarimetry in Reflection for Film Characterization;Sensors;2020-06-12
3. Investigating the experimental limits of the Brewster's angle method;TURKISH JOURNAL OF ELECTRICAL ENGINEERING & COMPUTER SCIENCES;2018-05-30
4. Determination of optical parameters of organic and inorganic thin films using both surface plasmon resonance and Abelès-Brewster methods;Optik;2017-08
5. Refractive index measurement of dielectric samples using highly focused radially polarized light (Invited Paper);Chinese Optics Letters;2017
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