Refractive index measurement of dielectric samples using highly focused radially polarized light (Invited Paper)-Reference-Cited by-同舟云学术

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Refractive index measurement of dielectric samples using highly focused radially polarized light (Invited Paper)

Published:2017 Issue:3 Volume:15 Page:030004-30007
ISSN:1671-7694
Container-title:Chinese Optics Letters
language:en
Short-container-title:中国光学快报

Author:

Guadalupe López-Morales Guadalupe López-Morales,Victor-Manuel Rico-Botero Victor-Manuel Rico-Botero,Rafael Espinosa-Luna Rafael Espinosa-Luna,and Qiwen Zhan and Qiwen Zhan

Publisher

Shanghai Institute of Optics and Fine Mechanics

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Measurement of refractive index of optical materials using improved Brewster method;PROC SPIE;2020

2. Vectorial vortex generation and phase singularities upon Brewster reflection;Physical Review A;2019-06-17

3. Polarization properties of a single polygon of the cuticle of the scarab beetle C. mutabilis studied by micropolarimetry;Optics Communications;2019-03

4. A miniaturized system for measurement of the refractive index of sub-microliter liquid;Chinese Optics Letters;2019

5. Imaging Mueller matrix determination of transparent, unpolarizing samples using a classically entangled polarization state;Revista Mexicana de Física;2018-06-28

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