Ellipsometry of anisotropic media-Reference-Cited by-同舟云学术

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Ellipsometry of anisotropic media

Published:1993-07-01 Issue:7 Volume:10 Page:1579
ISSN:1084-7529
Container-title:Journal of the Optical Society of America A
language:en
Short-container-title:J. Opt. Soc. Am. A

Author:

Lekner John

Publisher

The Optical Society

Subject

Computer Vision and Pattern Recognition,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference6 articles.

1. Reflection and refraction by uniaxial crystals

2. Normal-incidence reflection and transmission by uniaxial crystals and crystal plates

3. Ellipsometry with Non-Ideal Compensators

4. An Improved Method for High Reflectivity Ellipsometry Based on a New Polarization Modulation Technique

Cited by 13 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Reflection from uniaxial crystals: symmetries, and formulae for near-normal incidence;Journal of the Optical Society of America A;2023-03-10

2. Evaluation of Molecule Orientation on Liquid Surface in Transient State Using by Anisotropic Reflection;Nihon Reoroji Gakkaishi;2018-04-16

3. Ellipsometry;Theory of Reflection;2016

4. Characterizing dielectric tensors from angle-of-incidence Mueller matrix images;Polarization Science and Remote Sensing III;2007-09-13

5. Dielectric tensor measurement from a single Mueller matrix image;Journal of the Optical Society of America A;2007-02-14

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