Determining refractive index and thickness of thin films from wavelength measurements only
Author:
Publisher
The Optical Society
Subject
Computer Vision and Pattern Recognition,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference3 articles.
1. A simple method for the determination of the optical constants n, k and the thickness of a weakly absorbing thin film
2. Determination of the thickness and optical constants of amorphous silicon
3. Determination of surface roughness and optical constants of inhomogeneous amorphous silicon films
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