Autofocusing method for high-resolution three-dimensional profilometry
Author:
Funder
Directorate for Computer and Information Science and Engineering
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics
Reference15 articles.
1. Depth-driven variable-frequency sinusoidal fringe pattern for accuracy improvement in fringe projection profilometry
2. Projection defocus analysis for scene capture and image display
3. Improved intensity-optimized dithering technique for 3D shape measurement
4. Three-dimensional shape measurement with binary dithered patterns
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