Effects of optical activity to Mueller matrix ellipsometry of composed waveplates-Reference-Cited by-同舟云学术

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Effects of optical activity to Mueller matrix ellipsometry of composed waveplates

Published:2021-03-18 Issue:7 Volume:29 Page:10434
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Vala Daniel^ORCID,Koleják Pierre,Postava Kamil,Kildemo Morten,Provazníková Pavlína,Pištora Jaromír

Funder

Grantová Agentura České Republiky

European Regional Development Fund

EEA and Norway grants

Technology Agency of the Czech Republic

DGS - Doctoral Grant System

SGS - Student Grant System

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference72 articles.

1. Optical characterization of semiconductor saturable absorbers

2. Sensitivity analysis and line edge roughness determination of 28-nm pitch silicon fins using Mueller matrix spectroscopic ellipsometry-based optical critical dimension metrology

3. Spectroscopic ellipsometry and reflectometry from gratings (Scatterometry) for critical dimension measurement and in situ, real-time process monitoring

4. Mueller matrix ellipsometry of artificial non-periodic line edge roughness in presence of finite numerical aperture

5. Terahertz achromatic quarter-wave plate

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1. Reciprocal polarization imaging of optical activity in reflection;Optics Letters;2024-04-24

2. Dispersion models exhibiting natural optical activity: application to tartaric acid solutions;Journal of the Optical Society of America B;2023-11-21

3. Dispersion models exhibiting natural optical activity: theory of the dielectric response of isotropic systems;Journal of the Optical Society of America B;2023-10-25

4. Tunable birefringence and elliptical polarization eigenmodes in a biplate of two quarter-wave plates;Journal of the Optical Society of America A;2023-09-26

5. Intra-cavity selective absorption polarizer for a 1 µm solid-state laser;Optical Materials Express;2023-08-21

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