Normal-incidence generalized ellipsometry using the two-modulator generalized ellipsometry microscope-Reference-Cited by-同舟云学术

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Normal-incidence generalized ellipsometry using the two-modulator generalized ellipsometry microscope

Published:2006-08-01 Issue:22 Volume:45 Page:5479
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Jellison Jr. Gerald E.,Hunn John D.,Rouleau Christopher M.

Publisher

The Optical Society

Reference19 articles.

1. Extension of rotating-analyzer ellipsometry to generalized ellipsometry: determination of the dielectric function tensor from uniaxial TiO_2

2. Generalized ellipsometry and complex optical systems

3. Mueller matrix ellipsometry with imperfect compensators

4. Mueller matrix dual-rotating retarder polarimeter

5. Error analysis of a Mueller matrix polarimeter

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2. Optical functions of uniaxial zinc oxide (ZnO) revisited;Surface Science Spectra;2023-08-25

3. Texture analysis of AGR program matrix materials;Nuclear Engineering and Design;2022-11

4. Generalized Ellipsometry Measurements of Crystalline Thin Film and Bulk Tin Oxide;physica status solidi (a);2021-12-07

5. Electrodynamic solution for polarized reflectivity and wide-field orientation imaging of uniaxial metals;Journal of the Optical Society of America A;2021-11-09

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