Two-wavelength Talbot effect and its application for three-dimensional step-height measurement-Reference-Cited by-同舟云学术

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Two-wavelength Talbot effect and its application for three-dimensional step-height measurement

Published:2006-10-10 Issue:29 Volume:45 Page:7602
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Mehta Dalip Singh,Dubey Satish Kumar,Shakher Chandra,Takeda Mitsuo

Publisher

The Optical Society

Reference30 articles.

1. Range measurement using Talbot diffraction imaging of gratings

2. Real-time depth measurement and display using Fresnel diffraction and white-light processing

3. Lateral aberration measurements with a digital Talbot interferometer

4. Acquisition of 3-D data by focus sensing

Cited by 17 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. High-accuracy twist measurement based on the spherical wave Talbot effect for a bi-grid modulation collimator;Applied Optics;2021-07-26

2. Talbot effect based tunable setup for the measurement of stepped surfaces: Plane and spherical wavefront illumination;Optics Communications;2020-10

3. Dual wavelength Talbot self-imaging using facet patterned nonlinear crystals;Optics Letters;2019-07-24

4. High resolution measurement of freeform wavefront by using self-imaging based sensor;Optical Measurement Systems for Industrial Inspection XI;2019-06-21

5. Full-field wafer warpage measurement technique;Optical Measurement Systems for Industrial Inspection X;2017-06-26

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