Three-wavelength electronic speckle pattern interferometry with the Fourier-transform method for simultaneous measurement of microstructure-scale deformations in three dimensions-Reference-Cited by-同舟云学术

Three-wavelength electronic speckle pattern interferometry with the Fourier-transform method for simultaneous measurement of microstructure-scale deformations in three dimensions

Published:2006-05-10 Issue:14 Volume:45 Page:3218
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Flynn Eric B.,Bassman Lori C.,Smith Timothy P.,Lalji Zamir,Fullerton Laurel H.,Leung Tommy C.,Greenfield Scott R.,Koskelo Aaron C.

Publisher

The Optical Society

Reference15 articles.

1. Phase-shifting speckle interferometry

2. Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry

3. Fringe carrier methods in double-pulsed addition ESPI

4. Measurement of transient deformations with dual-pulse addition electronic speckle-pattern interferometry

5. Transient deformation measurement by double-pulsed-subtraction TV holography and the Fourier transform method

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