An image processing approach to approximating interface textures of microcrystalline silicon layers grown on existing aluminum-doped zinc oxide textures-Reference-Cited by-同舟云学术

An image processing approach to approximating interface textures of microcrystalline silicon layers grown on existing aluminum-doped zinc oxide textures

Published:2013-10-09 Issue:S6 Volume:21 Page:A977
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Hertel Kai,Hüpkes Jürgen,Pflaum Christoph

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference21 articles.

1. Amorphous Thin Film Growth: Modeling and Pattern Formation

2. Amorphous thin-film growth: Theory compared with experiment

3. Influence of interface morphologies on amorphous silicon thin film solar cells prepared on randomly textured substrates

4. Light trapping in periodically textured amorphous silicon thin film solar cells using realistic interface morphologies

5. Predicting the Interface Morphologies of Silicon Films on Arbitrary Substrates: Application in Solar Cells

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2. Coupling and Trapping of Light in Thin-Film Solar Cells Using Modulated Interface Textures;Applied Sciences;2019-11-01

3. Fourier transform based interface roughness analysis for flexible thin-film silicon solar cells;Journal of Photonics for Energy;2016-05-27

4. Random versus periodic: Determining light trapping of randomly textured thin film solar cells by the superposition of periodic surface textures;Solar Energy Materials and Solar Cells;2015-12

5. Analyzing periodic and random textured silicon thin film solar cells by Rigorous Coupled Wave Analysis;Scientific Reports;2014-08-12