Fourier transform based interface roughness analysis for flexible thin-film silicon solar cells

Author:

Abebe Birhanu Tamene1,Geißendörfer Stefan2,Pflaum Christoph1

Affiliation:

1. Fredrich-Alexander University of Erlangen-Nürnberg, School of Advanced Optical Technologies, Paul-Gordan-Street 6, Erlangen 91054, GermanybFredrich-Alexander University of Erlangen-Nürnberg, Chair of System Simulation, Cauer Street 11, Erlangen 91054, Ger

2. University of Oldenburg, NEXT ENERGY EWE Research Centre for Energy Technology, Carl-von-Ossietzky-Street 15, 26129 Oldenburg, Germany

Publisher

SPIE-Intl Soc Optical Eng

Subject

Renewable Energy, Sustainability and the Environment,Atomic and Molecular Physics, and Optics

Reference26 articles.

1. The SiSoFlex project: silicon based thin-film solar cells on flexible aluminium substrate;Geißendörfer,2014

2. Plasmonics for improved photovoltaic devices

3. Influence of back contact roughness on light trapping and plasmonic losses of randomly textured amorphous silicon thin film solar cells

4. Light management in thin-film solar cell;Krč,2012

5. All-optical switching in an N-type four-level atom-cavity system

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