Reflectance measurements and optical constants in the extreme ultraviolet-vacuum ultraviolet regions for SiC with a different C/Si ratio-Reference-Cited by-同舟云学术

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Reflectance measurements and optical constants in the extreme ultraviolet-vacuum ultraviolet regions for SiC with a different C/Si ratio

Published:2006-08-01 Issue:22 Volume:45 Page:5642
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Garoli Denis,Frassetto F.,Monaco G.,Nicolosi P.,Pelizzo M.-G.,Rigato F.,Rigato V.,Giglia A.,Nannarone S.

Publisher

The Optical Society

Reference19 articles.

1. Silicon-carbide diffraction grating for the vacuum ultraviolet: feasibility

2. Experimental comparison of extreme-ultraviolet multilayers for solar physics

3. Grazing incidence reflectance of SiC films produced by plasma-assisted chemical vapor deposition

4. Optical constants of SiC mirrors produced by different methods for photons of 60–1000 eV

5. Performance of high-density cast silicon carbide in the extreme ultraviolet

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