Electrical pump & probe and injected carrier losses quantification in Er doped Si slot waveguides-Reference-Cited by-同舟云学术

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Electrical pump & probe and injected carrier losses quantification in Er doped Si slot waveguides

Published:2012-12-12 Issue:27 Volume:20 Page:28808
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Ramírez J. M.,Berencén Y.,Lupi F. Ferrarese,Navarro-Urrios D.,Anopchenko A.,Tengattini A.,Prtljaga N.,Pavesi L.,Rivallin P.,Fedeli J. M.,Garrido B.

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference27 articles.

1. Silicon Photonics

2. The Past, Present, and Future of Silicon Photonics

3. Guiding, modulating, and emitting light on Silicon-challenges and opportunities

4. Erbium-doped integrated waveguide amplifiers and lasers

5. Low loss etchless silicon photonic waveguides

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Optical gain based on NaYF4: Er3+, Yb3+ nanoparticles-doped polymer waveguide under convenient LED pumping;Applied Physics Letters;2021-04-26

2. Charge trapping and physical parameters of Er3+ doped light-emitting field-effect transistors;physica status solidi (a);2014-01-22

3. Electrically pumped Er-doped light emitting slot waveguides for on-chip optical routing at 1.54 μm;SPIE Proceedings;2013-05-22

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