General theory of sub-quarterwave multilayers with highly absorbing materials
Author:
Publisher
The Optical Society
Subject
Computer Vision and Pattern Recognition,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference4 articles.
1. Reflectance enhancement with sub-quarterwave multilayers of highly absorbing materials
2. Reflectance measurements and optical constants in the extreme ultraviolet for thin films of ion-beam-deposited SiC, Mo, Mg_2Si, and InSb and of evaporated Cr
3. Reflectance measurements and optical constants in the extreme ultraviolet of thin films of ion-beam-deposited carbon
4. Preservation of far-UV aluminum reflectance by means of overcoating with C_60 films
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