Reliable optical characterization of e-beam evaporated TiO2films deposited at different substrate temperatures-Reference-Cited by-同舟云学术

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Reliable optical characterization of e-beam evaporated TiO2films deposited at different substrate temperatures

Published:2013-10-11 Issue:4 Volume:53 Page:A8
ISSN:1559-128X
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Amotchkina T.,Trubetskov M.,Tikhonravov A.,Angelov I. B.,Pervak V.

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics,Engineering (miscellaneous),Electrical and Electronic Engineering

Reference37 articles.

1. Thin-Film Optical Filters

2. Density and refractive index of TiO2 films prepared by reactive evaporation

3. New developments in magnetron sputter processes for precision optics

4. Microstructure and optical properties of TiO2 thin films deposited at different oxygen flow rates

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1. Reliable post-production characterization of TiO2/SiO2 electron-beam optical coatings based on multi-sample photometric and ellipsometric data;Advances in Optical Thin Films VIII;2024-06-24

2. Reverse engineering of e-beam deposited optical filters based on multi-sample photometric and ellipsometric data;Applied Optics;2022-12-13

3. Re-engineering of optical constants and layer thicknesses from in situ broadband monitoring: an oscillator model approach;Optics Continuum;2022-04-12

4. Characterization of Electron-beam Deposited TiO2/SiO2 Coatings Based on Multi-Sample Photometric and Ellipsometric Data;Optical Interference Coatings Conference (OIC) 2022;2022

5. Optical bandgap control in Al2O3/TiO2 heterostructures by plasma enhanced atomic layer deposition: Toward quantizing structures and tailored binary oxides;Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy;2021-05

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