Self-reference frequency response characterization of photodiode chips based on photonic sampling and microwave de-embedding

Abstract

In this work, we propose and demonstrate a self-reference on-chip testing method to obtain the frequency response characteristics of photodiode chips based on photonic sampling and microwave de-embedding. The half-frequency photonic sampling enables self-reference extraction of the combined response of the photodiode chip, the adapter network and the receiver network. The microwave de-embedding under short-open-load-device (SOLD) termination is used to realize on-chip de-embedding of the adapter network and the receiver network in terms of the transmission loss and the impedance mismatch. The proposed on-chip testing method is free of any extra electro-optical transducer standard, which is favorable for performance monitoring in chip evaluation.