Simultaneous microwave characterization of wafer-level optoelectronic transceiver chips based on photonic sampling and mapping
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Publisher
Springer Science and Business Media LLC
Link
https://link.springer.com/content/pdf/10.1007/s11432-023-3866-4.pdf
Reference5 articles.
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3. Zhang S J, Zhang C, Wang H, et al. On-wafer probingkit for RF characterization of silicon photonic integrated transceivers. Opt Express, 2017, 25: 13340–13350
4. He Y T, Xu Y, Zou X H, et al. High-frequency characterization of electro-optic modulation chips based on photonic down-conversion sampling and microwave fixture deembedding. Opt Express, 2022, 30: 40337–40346
5. He Y T, Jing C, Xu Y, et al. Self-reference frequency response characterization of photodiode chips based on photonic sampling and microwave de-embedding. Opt Express, 2022, 30: 2299–2309
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