Self-diffraction for intrinsic optical modulation evolution measurement in photoresists-Reference-Cited by-同舟云学术

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Self-diffraction for intrinsic optical modulation evolution measurement in photoresists

Published:1988-05-15 Issue:10 Volume:27 Page:1984
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Cescato Lucila,Frejlich Jaime

Publisher

The Optical Society

Reference6 articles.

1. Characterization of positive photoresist

2. Spectrophotometric Determination of Photoresist Photosensitivity

3. Analysis of a phase-modulating recording mechanism in negative photoresist

4. Stabilized holographic recording using the residual real-time effect in a positive photoresist

5. Analysis of an active stabilization system for a holographic setup

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Bibliography;Photorefractive Materials for Dynamic Optical Recording;2020-01-10

2. Optical recording mechanisms in undoped titanosillenite crystals;Journal of Applied Physics;2011-01-15

3. Holographic technique for measurement of the kinetic constant and optical modulation of photosensitive materials;Applied Optics;2010-06-14

4. Stable TiO[sub x] Submicrometer Channels;Journal of The Electrochemical Society;2003

5. Noise reduction in the recording of holographic masks in photoresist;SPIE Proceedings;1999-08-31

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