Ellipsometric analysis for surface roughness and texture
Author:
Publisher
The Optical Society
Reference24 articles.
1. Errors arising from surface roughness in ellipsometric measurement of the refractive index of a surface
2. Optical properties of thin films
3. Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometry
4. Surface roughness interpretation of ellipsometer measurements using the generalized Maxwell Garnett theory
5. Ellipsometric Parameters of Rough Surfaces and of a System Substrate-Thin Film with Rough Boundaries
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