Angularly resolved polarization microscopy for birefringent materials with Fourier ptychography

Abstract

Polarization light microscopy is a very popular approach for structural imaging in optics. So far these methods mainly probe the sample at a fixed angle of illumination. They are consequently only sensitive to the polarization properties along the microscope optical axis. This paper presents a novel method to resolve angularly the polarization properties of birefringent materials, by retrieving quantitatively the spatial variation of their index ellipsoids. Since this method is based on Fourier ptychography microscopy the latter properties are retrieved with a spatial super-resolution factor. An adequate formalism for the Fourier ptychography forward model is introduced to cope with angularly resolved polarization properties. The inverse problem is solved using an unsupervised deep neural network approach that is proven efficient thanks to its performing regularization properties together with its automatic differentiation. Simulated results are reported showing the feasibility of the methods.