Mixed-state ptychography for quantitative optical properties measurement of vector beam

Abstract

Recent advances in ptychography have extended to anisotropic specimens, but vectorial reconstruction of probes owing to polarization aliasing remains a challenge. A polarization-sensitive ptychography that enables full optical property measurement of vector light is proposed. An optimized reconstruction strategy, first calibrating the propagation direction and then performing faithful retrieval, is established. This method avoids multiple image acquisitions with various polarizer configurations and significantly improves the measurement accuracy by correlating the intensity and position of different polarization components. The capability of the proposed method to quantify anisotropic parameters of optical materials and polarization properties of vector probe is demonstrated by experiment.