Reflection zone plate concept for resonant inelastic x-ray scattering spectrometry-Reference-Cited by-同舟云学术

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Reflection zone plate concept for resonant inelastic x-ray scattering spectrometry

Published:2017-01-13 Issue:3 Volume:56 Page:515
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Braig Christoph,Löchel Heike,Rehanek Jens,Firsov Alexander,Brzhezinskaya Maria,Erko Alexei

Funder

Bundesministerium für Bildung und Forschung (BMBF)

Seventh Framework Programme (FP7)

Publisher

The Optical Society

Reference16 articles.

1. Off-axis reflection zone plate for quantitative soft x-ray source characterization

2. Nanometer focusing of X-rays with modified reflection zone plates

3. Focusing light with a reflection photon sieve

4. Design and optimization of a parallel spectrometer for ultra-fast X-ray science

5. Novel parallel vacuum ultra-violet/X-ray fluorescence spectrometer

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. High-Resolution, High-Efficiency Spectrometers for Laboratory Sources in the Soft X-ray Range;Optica High-brightness Sources and Light-driven Interactions Congress 2022;2022

2. Single-shot Monitoring of Ultrafast Processes via X-ray Streaking at a Free Electron Laser;Scientific Reports;2017-08-03

3. Highly efficient soft X-ray spectrometer based on a reflection zone plate for resonant inelastic X-ray scattering measurements;Optics Express;2017-05-03

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