Wavefront metrology measurements at SACLA by means of X-ray grating interferometry-Reference-Cited by-同舟云学术

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Wavefront metrology measurements at SACLA by means of X-ray grating interferometry

Published:2014-04-07 Issue:8 Volume:22 Page:9004
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Kayser Yves,Rutishauser Simon,Katayama Tetsuo,Ohashi Haruhiko,Kameshima Takashi,Flechsig Uwe,Yabashi Makina,David Christian

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference33 articles.

1. First lasing and operation of an ångstrom-wavelength free-electron laser

2. A compact X-ray free-electron laser emitting in the sub-ångström region

3. Sensing the wavefront of x-ray free-electron lasers using aerosol spheres

4. Full spatial characterization of a nanofocused x-ray free-electron laser beam by ptychographic imaging

5. Ronchi test for characterization of nanofocusing optics at a hard x-ray free-electron laser

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1. SwissFEL KB-optics at-wavelength wavefront characterisation;X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI;2023-06-16

2. Machine-learning calibration of intense x-ray free-electron-laser pulses using Bayesian optimization;Physical Review Research;2023-05-22

3. Wavefront preserving X-ray optics for Synchrotron and Free Electron Laser photon beam transport systems;Physics Reports;2022-08

4. X-ray wavefront sensing and optics metrology using a microfocus x-ray grating interferometer with electromagnetic phase stepping;Applied Physics Letters;2022-05-02

5. Optics metrology and at-wavelength wavefront characterization by a microfocus X-ray grating interferometer;Optics Express;2021-07-02

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