Ronchi test for characterization of nanofocusing optics at a hard x-ray free-electron laser-Reference-Cited by-同舟云学术

Ronchi test for characterization of nanofocusing optics at a hard x-ray free-electron laser

Published:2012-12-05 Issue:24 Volume:37 Page:5046
ISSN:0146-9592
Container-title:Optics Letters
language:en
Short-container-title:Opt. Lett.

Author:

Nilsson Daniel,Uhlén Fredrik,Holmberg Anders,Hertz Hans M.,Schropp Andreas,Patommel Jens,Hoppe Robert,Seiboth Frank,Meier Vivienne,Schroer Christian G.,Galtier Eric,Nagler Bob,Lee Hae Ja,Vogt Ulrich

Funder

Swedish Research Council

Göran Gustafsson Foundation

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference10 articles.

1. Introduction to the new science with X-ray free electron lasers

2. The Race to X-ray Microbeam and Nanobeam Science

3. High-Resolution Scanning X-ray Diffraction Microscopy

4. Hard x-ray nanobeam characterization by coherent diffraction microscopy

5. Spot size characterization of focused non-Gaussian X-ray laser beams

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