Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging-Reference-Cited by-同舟云学术

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Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging

Published:2011-10-12 Issue:22 Volume:19 Page:21333
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Vila-Comamala Joan,Diaz Ana,Guizar-Sicairos Manuel,Mantion Alexandre,Kewish Cameron M.,Menzel Andreas,Bunk Oliver,David Christian

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference33 articles.

1. Focusing of hard x-rays to 16 nanometers with a multilayer Laue lens

2. Breaking the 10 nm barrier in hard-X-ray focusing

3. Ultra-high resolution zone-doubled  diffractive X-ray optics for the multi-keV regime

4. X-Ray Diffraction Microscopy

5. Coherent methods in the X-ray sciences

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2. High-resolution ptychographic imaging at a seeded free-electron laser source using OAM beams;Optica;2024-03-18

3. Ultracompact mirror device for forming 20-nm achromatic soft-X-ray focus toward multimodal and multicolor nanoanalyses;Nature Communications;2024-02-07

4. Carbon Nanotubes Facilitate Silk Hierarchical Assembly by Dry Drawing;Small Structures;2024-01-22

5. High-resolution and high-sensitivity X-ray ptychographic coherent diffraction imaging using the CITIUS detector;Journal of Synchrotron Radiation;2023-08-01

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